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OnChip's Micros G2 Tag offers our clients broader applications at an inexpensive cost.
With readability from a distance of 0-3mm, the applications for this unique design of RFID technology, becomes endless.
Asset Verification
OnChip's Micros G2 Tag has been embedded in bank notes to prevent forgery and verify authenticity. Money laundering through Black Market tactics can be eliminated.
Our Micros G2 Tag has also been embedded in security documents to also verify their authenticity and track their flow through the system.
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Asset Management & Supply Chain Inventory Reporting
OnChip's Micros G2 Tag has been embedded into semi-conductor components to facilitate inventory tracking in the manufacturing of integrated circuits. Micros G2 Tag's also confirm the authenticity of these products against their warranty and possible forgery attempts.
Medical Accuracy & Loss Prevention
OnChip's Micros G2 Tag can be embedded in metal, plastic, glass, and have been used in the medical settings to track inventory of prescription drugs.
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Authenticity of Designer Products
OnChip's Micros G2 Tag has been embedded in designer watches to ensure authenticity and end piracy. In several instances, our Micros G2 Tag has been implmented into designer accessories to create an unseen level of verifiable authenticity.
Anti-theft and Authenticity of Rare Art
OnChip's Micros G2 Tag has also been used to tag expensive, one of a kind, priceless art. Micros G2 Tag can be attached to the most inconspicuous spot. Barely seen by the trained eye.
Tracking the movement and existance of Bee's
OnChip's Micros G2 Tag can also be used to tag Bee's to track their migration and movement within the hive. Studies are currently underway to assist researcher's explain the vast reduction in bee population.
All OnChip tags are compatible with RAIN:http://rainrfid.org/about-rain/what-is-rain/
Genesis XL Tag Specifications:
101386- Genesis XL Tag (UHF)
Size: 0.41mm x 0.43mm x 0.09mm *
Support Protocol: OCA, EPC Class 1 UCODEG2XMUHF ISO 18000-63
Operating Frequency: 840MHz-960MHz(UHF).
* Not yet available for MP.
Micros G2 Tag Specifications:
102779 - Micros G2 Tag (UHF)
Size: 0.41mm x 0.43mm x 0.125mm
Support Protocol: OCA, EPC Class 1 UCODEG2XMUHF ISO 18000-63
Operating Frequency: 840MHz-960MHz(UHF).
102779 - Micros G2 Tag (UHF) is also available in an adhesive substrate for spraying onto a metal or solid surface, at 15~18psi.
Antenna's:
001-Micro Antenna (externalized). Dental (read range: contact).
003-Micro Spot Antenna (externalized). Near field (read range: 0mm to 3mm).
004-Micros Stripe Antenna (externalized) 2-3cm long. Near field (read range: 0mm to 3mm).
Reader's:
Mobile Reader (general specifications): R/W EP Global UHF Class 1 Gen2 Reader for Android powered handsets and tablets. USB version. Additional information on purchasing will be supplied upon request.
Stationary Reader: UHF RFID - Internet Ready
To see what OnChip can do for your business, contact us.
OnChip Offers Visual Inspection Services for Wafers or Bare Die
Semiconductor ICs (Integrated Circuits) are extremely fragile and endure a variety of stresses during wafer fabrication, testing and dicing. They are easily prone to defects that would either prevent the device from operating correctly or pose a reliability concern for long-term operation. These defects are caused either during wafer fabrication or mechanically-induced during handling. The extent to which any defect may be acceptable would be defined by the appropriate criteria selected to fit the application environment. Units that are defective can be effectively removed by visually inspecting the devices under high magnification. There are many different inspection criteria, but the most common one is MIL-STD-883, Method 2010. This inspection standard defines the equipment to be used for the inspection, magnification ranges, what defects to look for and quantifies the amount of any particular defect that is acceptable.
The ability to visually inspect a circuit requires a lot of skill and training which increases through experience and a continuous training program. OnChip employs a highly qualified staff of inspectors who have over 30 years of experience in this field. We work very closely with our customers at the beginning to ensure we are calibrated to their inspection needs. Visual inspection services are offered either in wafer-form or after the device has been sawn and placed in chip trays such as waffle packs or gelpaks.
OnChip offers 100% visual inspection using both low and high power microscopes that meet Commercial, Military and Medical Electronics specifications. Inspection is done to look for various types of visual defects. Some of the more common defects include:
- Embedded foreign material
- Metallization or Passivation voids & irregularities
- Contamination such as liquid or adhesive residues and surface particles
- Surface scratches caused by test probes or wafer handlers
- Dicing defects such as chip outs and cracks
For more info emailsales@onchip.comor call (408) 654-9365.